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PhotolithographySilicon on insulatorPlanar processMultiple patterningSemiconductor device fabricationSemiconductor industryRca cleanComputer-aided manufacturingComputer-integrated manufacturingFabless manufacturingPhysical verificationNanolithographyIndustrial control systemRoutingIntegrated circuit packagingIntegrated circuit designManufacturing execution systemModel predictive controlAdvanced process controlMaterial requirements planningMicroviaFront end of lineSoft lithographyProcessor designCircuit designProcess design kitIntegrated circuit layoutMachine visionComputational lithographyLinear integrated circuitAssembly modellingFunctional verificationKnowledge-based engineeringDigital modeling and fabricationStandard cellComputer architectureMonocrystalline siliconPrinted circuit board millingSemiconductor deviceThrough-silicon viaSemiconductor memoryOperational technologyChip carrierProcess automation systemElectronic packagingSalicideChip artProcess controlSolid-state electronicsDesign rule checkingComputer-aided quality assuranceSurface-mount technologyIntegrated quantum photonicsComputer-aided technologiesMulti-project wafer servicePackmlProcess validationBall grid arrayConfiguration managementElectronic design automationIntegrated circuitChipsetPlace and routeDigital light processingDigital electronicsCellHardware architectureColor filter arrayTexture mappingAtomic layer etchingMicrostripScadaStepping levelFan-out wafer-level packaging2 nm processSoftware architectureTape-outDot matrix printingFormal equivalence checkingMicroarchitectureCellular manufacturingMicrocodeTest design techniqueDigital microfluidicsHardware description languageShallow trench isolationDesign for manufacturabilityData modeling3 nm processSoftware configuration managementSoftware system safetyNumerical controlGlue logicColor layout descriptorComputer-aided designSecurity engineeringSoftware verification7 nm processOptical add-drop multiplexer10 nm process