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Transmission electron microscopyElectron backscatter diffractionScanning electron microscopeTransmission electron microscopeField-emission microscopyX-ray diffractionX-ray crystallographyScanning tunneling microscopeCryogenic electron microscopyNanotomographyNeutron diffractionElectron microscopeElectron paramagnetic resonanceAnnular dark-field imagingMicrographyMetal l-edgeScanning tunneling spectroscopyScanning probe microscopyStauroscopeSecondary ion mass spectrometryElectrostatic force microscopeElectronographyPowder diffractionDiffractometerSelected area diffractionAtomic force microscopyAtomic absorption spectroscopyPhotoemission spectroscopyElectron diffractionDeep-level transient spectroscopySmall-angle x-ray scatteringElectron capture detectorSolid-state physicsMaterials oscilloscopeNeutron spectrometryElectronic structureFluorescence spectroscopyMicrospectroscopeOptical sectioningEpifluorescence microscopyAtomic emission spectroscopyMicrographMicroscopeParticle-induced x-ray emissionElectron spectroscopyEpifluorescence microscopeSurface reconstructionMicroprobeField emission microscopyPetrographic microscopeCrystallizationLow-energy ion scatteringElectron-transfer dissociationSted microscopyElectron configurationDynamical mean-field theoryX-ray microscopeElectron microprobeElectron energy loss spectroscopyTime-resolved spectroscopySpectrophotometryAtomic physicsContrast transfer functionSpectrometerAtomic force microscopeStimulated raman spectroscopyField emission microscopeElectronic correlationPhase contrast microscopyNanoscopyMicroradiographyMolecular beam epitaxyStructure factorMultisliceElectrofocusingOptical microscopeX-ray spectrometerElectron cyclotron resonanceEllipsometryElectrochemistryNeutron activation analysisSmall-angle neutron scatteringRotational spectroscopyMagnetic force microscopeScanning squid microscopyElectrochromatographyNeutron scatteringIon beam analysisMolecular orbital theoryScanning acoustic microscopeAbsorption spectroscopyMicrowave spectroscopyMolecular electronicsPositron annihilation spectroscopyNeutron interferometerMicrochannel plate detectorElastic scatteringThin sectionAlpha-particle spectroscopyDynamic light scattering