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Scanning electron microscopeElectron crystallographyField-emission microscopyTransmission electron microscopySelected area diffractionPowder diffractionLow-energy ion scatteringX-ray crystallographyMaterials oscilloscopeTransmission electron microscopeX-ray diffractionScanning tunneling spectroscopyNeutron diffractionSecondary ion mass spectrometryLaser diffraction analysisEpifluorescence microscopyMagnetic force microscopeScanning probe microscopyDiffractometerLow-energy electron diffractionEpifluorescence microscopeElectron paramagnetic resonanceNanotomographyPhotoemission spectroscopyCryogenic electron microscopyElectron microscopeSmall-angle neutron scatteringElectron microprobeScanning tunneling microscopeScanning acoustic microscopeSmall-angle x-ray scatteringPhase contrast microscopyElectrostatic force microscopePhotoemission electron microscopyStimulated raman spectroscopyAnnular dark-field imagingMicroprobeOptical coherence tomographyField emission microscopyElastic recoil detectionScanning squid microscopyFluorescence spectroscopyOptical spectrometerThin sectionFluorescence microscopeMicroscopyAbsorption spectroscopyMultisliceOptical microscopeDeep-level transient spectroscopyAtomic absorption spectroscopyMetal l-edgeTip-enhanced raman spectroscopyElectron spectroscopySted microscopyIon beam analysisSpectrophotometryAuger electron spectroscopyPetrographic microscopeElectron diffractionElectron-beam lithographySuper-resolution microscopyMicrographMicrographySpectroscopyElectrophoretic light scatteringDiffraction patternAtomic force microscopyMicrospectroscopeElectrical resistivity tomographyX-ray spectrometerStructure factorInfrared spectroscopyMuon spin spectroscopyDynamic light scatteringConfocal microscopyFourier-transform spectroscopyPositron annihilation spectroscopyTime-resolved spectroscopyAtomic emission spectroscopyStauroscopePiezoresponse force microscopyElectron-beam technologyParticle-induced x-ray emissionElectron spin resonanceMicrolithographyEllipsometryElectron capture detectorCavity ring-down spectroscopyPhotoacoustic spectroscopyOptical sectioningAttenuated total reflectanceSpectroelectrochemistryTransflectionDeep inelastic scatteringGrazing incidence diffractionDensity functional theoryMicrowave spectroscopyRigorous coupled-wave analysisRefractometry