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Polysilicon depletion effectWhite plaguePotential-induced degradationPurple plagueConducted emissionsElectromagnetic interferenceShort-channel effectLatch-upMultipactor effectGround bounceIntergranular corrosionConducted interferenceCrosstalkRadiation resistanceMosfetThermal oxidationElectrostatic-sensitive deviceChip shortageGate oxideSilicon on insulatorShort circuitLiquid metal embrittlementDrain-induced barrier loweringFurnace annealRadiation damageNegative resistanceGgnmosParasitic capacitanceRf cmosMosfet applicationsInterconnect bottleneckParasitic elementPlasma electrolytic oxidationMicrophonicsDeep-level trapThick-film technologyPlanar processTombstoningBurst noiseForeign object damagePlasma etchingIntersymbol interferenceLaser rotPartial dischargeStuck-at faultSemiconductor device fabricationEnvironmental stress crackingGiant magnetoresistanceElectrical breakdownMagnetoresistanceDie shrinkMicrovoid coalescenceEnvironmental stress screeningHazardGeomagnetically induced currentImpatt diodePower dissipationQuantum electronicsAnodic bondingMetal gatePlasma oscillationAvalanche breakdownHydrogen embrittlementCarrier frequency offsetDegenerate semiconductorSemiconductor detectorInterferenceElectronicsPlasma ashingGrating lobesMultiple patterningThermal degradation of polymersPiezoresistive effectPhotoelectromagnetic effectBias distortionIntegrated circuit packagingNoise temperatureMolecular beam epitaxyPlasmonicsDislocationLevel-sensitive scan designMiller effectIntermodulationSoft errorDeep reactive-ion etchingAirbridgeElectromagnetic pulseDeep-level transient spectroscopyReverse leakage currentTunnel junctionTransmission line measurementRadiation hardeningHigh temperature hydrogen attackPiezotronicsClock skewSalicideBack end of lineOverlay controlIntegrated circuit designKohn anomaly